Please use this identifier to cite or link to this item: https://physrep.ff.bg.ac.rs/handle/123456789/1043
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dc.contributor.authorStojadinović, Stevanen
dc.contributor.authorTadić, N.en
dc.contributor.authorVasilić, Rastkoen
dc.date.accessioned2022-07-12T18:11:57Z-
dc.date.available2022-07-12T18:11:57Z-
dc.date.issued2015-01-10en
dc.identifier.issn0013-4686en
dc.identifier.urihttps://physrep.ff.bg.ac.rs/handle/123456789/1043-
dc.description.abstractLuminescence during a constant current electrolytic oxidation of tantalum in phosphoric acid and oxalic acid is investigated. Weak anodic luminescence (galvanoluminescence) of barrier oxide films during the electrolytic oxidation is correlated to the existence of surface imperfections. Galvanoluminescence is more intense for rougher tantalum samples, higher current density, and higher electrolyte temperature. Spectral characterization of galvanoluminescence showed that there are wide luminescence bands mostly in the visible and near infrared spectral region. Small sized sparks generated by dielectric breakdown cause rapidly increasing luminescence intensity. The luminescence spectrum under spark discharging has several intensive peaks caused by electronic transitions in oxygen and hydrogen atoms.en
dc.relation.ispartofElectrochimica Actaen
dc.subjectelectrolyticen
dc.subjectgalvanoluminescenceen
dc.subjectoxidationen
dc.subjectspark dischargesen
dc.subjecttantalumen
dc.titleLuminescence of oxide films during the electrolytic oxidation of tantalumen
dc.typeArticleen
dc.identifier.doi10.1016/j.electacta.2014.11.158en
dc.identifier.scopus2-s2.0-84918832818en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/84918832818en
dc.relation.volume152en
dc.relation.firstpage323en
dc.relation.lastpage329en
item.openairetypeArticle-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
crisitem.author.orcid0000-0002-6589-6296-
crisitem.author.orcid0000-0001-9002-9779-
crisitem.author.orcid0000-0003-2476-7516-
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