Characterization of porous anodic aluminum oxide films by luminescence methods - a review

Abstract

This review is a summary of applications of photoluminescence and galvanoluminescence techniques used to determine important characteristics of the porous anodic aluminum oxide films. Both photoluminescence and galvanoluminescence of porous anodic oxide films formed on highly reflective aluminum surfaces in either organic or inorganic electrolytes feature clearly pronounced interference maxima that can be used as a tool for determining oxide film thickness and inherent optical parameters. Following this finding, two methods (based on a particular observation angle) for determining such properties are developed and presented. Developed methods can be used for either galvano-luminescence or photoluminescence measurements, however only galvanoluminescence technique can be used to estimate the thickness of porous oxide films on aluminum during the anodization.