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Please use this identifier to cite or link to this item: https://physrep.ff.bg.ac.rs/handle/123456789/1051
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dc.contributor.authorBajat, J. B.en_US
dc.contributor.authorVasilić, R.en_US
dc.contributor.authorStojadinović, Stevanen_US
dc.contributor.authorMišković-Stankovic, V.en_US
dc.date.accessioned2022-07-12T18:11:58Z-
dc.date.available2022-07-12T18:11:58Z-
dc.date.issued2013-07-01-
dc.identifier.issn0010-9312en
dc.identifier.urihttps://physrep.ff.bg.ac.rs/handle/123456789/1051-
dc.description.abstractElectrochemical properties of oxide coatings formed by plasma electrolytic oxidation (PEO) on aluminum in sodium tungstate (Na2WO 4·2H2O) with respect to process time were investigated using electrochemical impedance spectroscopy (EIS). Presence of tungsten was beneficial for the corrosion stability of obtained oxide coatings. However, neither the amount of tungsten in the oxide coating nor the coatings thickness were identified as important factors in corrosion stability of PEO coatings, i.e., morphology and porosity solely govern the corrosion stability of PEO coatings. The evolution of EIS spectra with immersion time for coatings anodized for 5 min and 7.5 min point to more efficient corrosion protection of aluminum substrate, compared to other tested samples. © 2013, NACE International.en
dc.relation.ispartofCorrosionen
dc.subjectAluminumen
dc.subjectCorrosionen
dc.subjectElectrochemical impedance spectroscopyen
dc.subjectOxide coatingsen
dc.titleCorrosion stability of oxide coatings formed by plasma electrolytic oxidation of aluminum: Optimization of process timeen_US
dc.typeArticleen_US
dc.identifier.doi10.5006/0859-
dc.identifier.scopus2-s2.0-84880747078-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/84880747078-
dc.relation.issue7en
dc.relation.volume69en
dc.relation.firstpage693en
dc.relation.lastpage702en
item.openairetypeArticle-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
crisitem.author.orcid0000-0003-2476-7516-
crisitem.author.orcid0000-0002-6589-6296-
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