Please use this identifier to cite or link to this item: https://physrep.ff.bg.ac.rs/handle/123456789/1170
DC FieldValueLanguage
dc.contributor.authorVidenović, Ivanen
dc.contributor.authorThommen, Verenaen
dc.contributor.authorOelhafen, Peteren
dc.contributor.authorMathys, Danielen
dc.contributor.authorDüggelin, Marcelen
dc.contributor.authorGuggenheim, Richarden
dc.date.accessioned2022-07-12T18:33:16Z-
dc.date.available2022-07-12T18:33:16Z-
dc.date.issued2002-04-22en
dc.identifier.issn0003-6951en
dc.identifier.urihttps://physrep.ff.bg.ac.rs/handle/123456789/1170-
dc.description.abstractGold containing amorphous hydrogenated carbon (a-C:H/Au) thin films are studied by means of ex situ atomic-force and scanning electron microscopy, and in situ x-ray photoelectron spectroscopy. Introducing a dc substrate bias voltage during magnetron plasma-assisted chemical-vapor deposition of a-C:H/Au results in significant changes of surface morphology and nanocluster arrangement, compared to films deposited on electrically grounded substrates. Grounded samples are rather flat (below 1 nm of roughness), with topmost Au clusters covered with a very thin, nanometer-range layer of a-C:H. On the other hand, the biased sample surface is characterized by large bump structures (up to 13 nm in height) and bald gold clusters. © 2002 American Institute of Physics.en
dc.relation.ispartofApplied Physics Lettersen
dc.titleInfluence of substrate bias voltage on surface morphology and nanocluster arrangement of gold containing amorphous hydrogenated carbonen
dc.typeArticleen
dc.identifier.doi10.1063/1.1471380en
dc.identifier.scopus2-s2.0-79956015677en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/79956015677en
dc.relation.issue16en
dc.relation.volume80en
dc.relation.firstpage2863en
dc.relation.lastpage2865en
item.openairetypeArticle-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
crisitem.author.orcid0000-0002-4307-6473-
Appears in Collections:Journal Article
Show simple item record

SCOPUSTM   
Citations

4
checked on Nov 16, 2024

Page view(s)

31
checked on Nov 22, 2024

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.