Please use this identifier to cite or link to this item: https://physrep.ff.bg.ac.rs/handle/123456789/1174
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dc.contributor.authorBabonneau, Daviden
dc.contributor.authorSuárez-García, Ameliaen
dc.contributor.authorGonzalo, Joséen
dc.contributor.authorVidenović, Ivanen
dc.contributor.authorGarnier, Michael G.en
dc.contributor.authorOelhafen, Peteren
dc.contributor.authorJaouen, Michelen
dc.contributor.authorNaudon, Andréen
dc.date.accessioned2022-07-12T18:33:16Z-
dc.date.available2022-07-12T18:33:16Z-
dc.date.issued2001-01-01en
dc.identifier.issn0272-9172en
dc.identifier.urihttps://physrep.ff.bg.ac.rs/handle/123456789/1174-
dc.description.abstractGrazing incidence small-angle x-ray scattering (GISAXS) allows to investigate precisely the microstructure of nanocomposite thin films containing metal nanocrystals produced using different synthesis techniques. We present results on the size, size distribution, shape, and correlation length of metallic nanoparticles embedded in different matrices fabricated by sequential pulsed laser deposition, magnetron sputtering, and ion-beam sputtering co-deposition. The morphology of the nanoparticles is discussed in terms of the different growth process that takes place in each case.en
dc.relation.ispartofMaterials Research Society Symposium - Proceedingsen
dc.titleGrazing incidence small-angle x-ray scattering applied to the characterization of nanocomposite thin filmsen
dc.typeArticleen
dc.identifier.doi10.1557/proc-678-ee5.6.1en
dc.identifier.scopus2-s2.0-85010737615en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/85010737615en
dc.relation.volume678en
dc.relation.firstpageEE5.6.1en
dc.relation.lastpageEE5.6.6en
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
item.cerifentitytypePublications-
item.openairetypeArticle-
crisitem.author.orcid0000-0002-4307-6473-
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