Please use this identifier to cite or link to this item: https://physrep.ff.bg.ac.rs/handle/123456789/117
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dc.contributor.authorStojadinović, Stevanen
dc.contributor.authorVasilić, Rastkoen
dc.contributor.authorBelča, Ivanen
dc.contributor.authorTadic, M.en
dc.contributor.authorKasalica, Bećkoen
dc.contributor.authorZeković, Ljubišaen
dc.date.accessioned2022-06-30T15:20:56Z-
dc.date.available2022-06-30T15:20:56Z-
dc.date.issued2008-12-30en
dc.identifier.issn0169-4332en
dc.identifier.urihttps://physrep.ff.bg.ac.rs/handle/123456789/117-
dc.description.abstractAtomic force microscopy (AFM) and luminescence methods (galvanoluminescence and photoluminescence) were used to characterize porous oxide films obtained by aluminum anodization in sulfamic acid solution. For the first time we measured weak galvanoluminescence during aluminum anodization in sulfamic acid and found strong influence of sample's surface pretreatment as well as anodic conditions on luminescence intensity. AFM analysis showed that the pore arrangement of porous oxide films formed in sulfamic acid by two-step anodization process at a constant voltage of 15-30 V is relatively irregular. © 2008 Elsevier B.V. All rights reserved.en
dc.relation.ispartofApplied Surface Scienceen
dc.subjectAluminumen
dc.subjectGalvanoluminescenceen
dc.subjectPhotoluminescenceen
dc.subjectPorous oxide filmsen
dc.subjectSulfamic aciden
dc.titleStructural and luminescence characterization of porous anodic oxide films on aluminum formed in sulfamic acid solutionen
dc.typeArticleen
dc.identifier.doi10.1016/j.apsusc.2008.08.023en
dc.identifier.scopus2-s2.0-57049105128en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/57049105128en
dc.relation.issue5 PART 2en
dc.relation.volume255en
dc.relation.firstpage2845en
dc.relation.lastpage2850en
item.grantfulltextnone-
item.openairetypeArticle-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.fulltextNo Fulltext-
crisitem.author.orcid0000-0002-6589-6296-
crisitem.author.orcid0000-0003-2476-7516-
crisitem.author.orcid0000-0001-6124-5333-
crisitem.author.orcid0000-0002-8300-6234-
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