Please use this identifier to cite or link to this item: https://physrep.ff.bg.ac.rs/handle/123456789/565
DC FieldValueLanguage
dc.contributor.authorMilosavljević, Vladimiren
dc.contributor.authorDonegan, Micken
dc.contributor.authorCullen, Patrick J.en
dc.contributor.authorDowling, Denis P.en
dc.date.accessioned2022-07-12T16:01:37Z-
dc.date.available2022-07-12T16:01:37Z-
dc.date.issued2014-01-15en
dc.identifier.issn0031-9015en
dc.identifier.urihttps://physrep.ff.bg.ac.rs/handle/123456789/565-
dc.description.abstractIn this paper optical emission spectroscopy (OES) is used as a Diagnostic technique for the measurement of atomic and molecular spectral emissions generated using a helium rf industrial atmospheric plasma jet system. The OES of neutral atomic spectral lines and molecular bands are investigated over a range of plasma process parameters. Wavelength resolve optical emission profiles suggest that the emission of helium's spectral lines shows that the high energy electrons have a larger influence than helium metastables on the overall spectral emission. Furthermore, the experimental data indicates that the use of high helium flow rates, in any confined open air plasma discharge, limits the significance of air impurities, e.g., nitrogen, for the creation and sustainability of plasma discharges in helium-oxygen gas chemistry. ©2014 The Physical Society of Japan.en
dc.relation.ispartofJournal of the Physical Society of Japanen
dc.titleDiagnostics of an O<inf>2</inf>-He RF atmospheric plasma discharge by spectral emissionen
dc.typeArticleen
dc.identifier.doi10.7566/JPSJ.83.014501en
dc.identifier.scopus2-s2.0-84897804996en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/84897804996en
dc.relation.issue1en
dc.relation.volume83en
item.openairetypeArticle-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
crisitem.author.orcid0000-0002-7805-5189-
Appears in Collections:Journal Article
Show simple item record

SCOPUSTM   
Citations

28
checked on Nov 20, 2024

Page view(s)

26
checked on Nov 25, 2024

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.