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Please use this identifier to cite or link to this item: https://physrep.ff.bg.ac.rs/handle/123456789/636
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dc.contributor.authorDamnjanović, M.en
dc.contributor.authorVuković, Tatjanaen
dc.contributor.authorMilošević, Ivankaen
dc.date.accessioned2022-07-12T16:26:37Z-
dc.date.available2022-07-12T16:26:37Z-
dc.date.issued2011-04-15en
dc.identifier.issn0921-5107en
dc.identifier.urihttps://physrep.ff.bg.ac.rs/handle/123456789/636-
dc.description.abstractFull symmetry based analysis enables direct insight into various features of the diffraction patterns of carbon nanotubes. In particular, determination of the chiral indices of nanotubes may be performed. © 2010 Elsevier B.V. All rights reserved.en
dc.relation.ispartofMaterials Science and Engineering B: Solid-State Materials for Advanced Technologyen
dc.subjectCarbonen
dc.subjectCrystal symmetryen
dc.subjectDiffractionen
dc.subjectNanotubesen
dc.titleDiffraction from carbon nanotubesen
dc.typeArticleen
dc.identifier.doi10.1016/j.mseb.2010.05.006en
dc.identifier.scopus2-s2.0-79953173591en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/79953173591en
dc.relation.issue6en
dc.relation.volume176en
dc.relation.firstpage497en
dc.relation.lastpage499en
item.openairetypeArticle-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
crisitem.author.orcid0000-0002-2967-2826-
crisitem.author.orcid0000-0001-6885-7201-
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