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Please use this identifier to cite or link to this item: https://physrep.ff.bg.ac.rs/handle/123456789/836
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dc.contributor.authorNađđerđ, L. J.en
dc.contributor.authorSubotić, K. M.en
dc.contributor.authorTsyganov, Yu S.en
dc.contributor.authorPuzović, Jovanen
dc.contributor.authorPolyakov, A. N.en
dc.contributor.authorRykhlyuk, A. V.en
dc.contributor.authorManić, D.en
dc.date.accessioned2022-07-12T17:16:51Z-
dc.date.available2022-07-12T17:16:51Z-
dc.date.issued2017-10-01en
dc.identifier.issn0168-9002en
dc.identifier.urihttps://physrep.ff.bg.ac.rs/handle/123456789/836-
dc.description.abstractThe life time distribution measurements of the alpha emitter 216Po have been performed with semiconductor detectors. We applied a new method to obtain the distribution of time intervals between the correlated signals of decay of the 216Po. The deduced half-life of 216Po was found to be 144.0(6) ms, supporting the earlier published measurements and with an uncertainty much lower than any other previously reported value.en
dc.relation.ispartofNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipmenten
dc.subject216 Po half-lifeen
dc.subjectAlpha spectrometryen
dc.subjectLife-times distributionen
dc.titleMeasurement of the life-times distribution of <sup>216</sup>Poen
dc.typeArticleen
dc.identifier.doi10.1016/j.nima.2017.06.055en
dc.identifier.scopus2-s2.0-85023610410en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/85023610410en
dc.relation.volume868en
dc.relation.firstpage119en
dc.relation.lastpage121en
item.openairetypeArticle-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
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