1. PHYSREPository
  2. Research Outputs
  3. Journal Article
Please use this identifier to cite or link to this item: https://physrep.ff.bg.ac.rs/handle/123456789/93
DC FieldValueLanguage
dc.contributor.authorStojadinović, Stevanen
dc.contributor.authorZeković, Ljubišaen
dc.contributor.authorBelča, Ivanen
dc.contributor.authorKasalica, Bećkoen
dc.date.accessioned2022-06-30T15:20:53Z-
dc.date.available2022-06-30T15:20:53Z-
dc.date.issued2004-01-01en
dc.identifier.issn1388-2481en
dc.identifier.urihttps://physrep.ff.bg.ac.rs/handle/123456789/93-
dc.description.abstractThe presented results of our galvanoluminescence measurements of porous oxide films formed by anodization of aluminum in phosphoric acid show strong influence of the surface pretreatment of samples and concentration of impurities on galvanoluminescence intensity. We have also presented the influence of anodic conditions (current density, temperature of electrolyte and electrolyte concentration) on GL intensity. For the first time, spectral measurements of galvanoluminescence for early stage of film growth (barrier type of films) as well as for thick porous film are performed. We have obtained identical spectra with two spectral peaks at about 425 and 595 nm. © 2004 Elsevier B.V. All rights reserved.en
dc.relation.ispartofElectrochemistry Communicationsen
dc.subjectGalvanoluminescenceen
dc.subjectPhosphoric aciden
dc.subjectPorous anodic filmsen
dc.subjectSpectraen
dc.titleGalvanoluminescence of oxide films formed by anodization of aluminum in phosphoric aciden
dc.typeArticleen
dc.identifier.doi10.1016/j.elecom.2004.02.016en
dc.identifier.scopus2-s2.0-1642370702en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/1642370702en
dc.relation.issue4en
dc.relation.volume6en
dc.relation.firstpage427en
dc.relation.lastpage431en
item.openairetypeArticle-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
crisitem.author.orcid0000-0002-6589-6296-
crisitem.author.orcid0000-0001-6124-5333-
crisitem.author.orcid0000-0002-8300-6234-
Appears in Collections:Journal Article
Show simple item record

SCOPUSTM   
Citations

24
checked on Nov 20, 2024

Page view(s)

17
checked on Nov 21, 2024

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.