Please use this identifier to cite or link to this item:
https://physrep.ff.bg.ac.rs/handle/123456789/1377
Title: | On the use of Ar I 517.753 nm spectral line for electric field measurements in the cathode sheath of a Grimm-type glow discharge source | Authors: | Nedić, Nikodin Ivanović, Nikola V. Videnović, Ivan Spasojević, Đorđe |
Issue Date: | 1-Jan-2023 | Journal: | European Physical Journal D | Abstract: | We present the results of the optical emission spectroscopy study of the Ar I 517.753 nm spectral line, observed at different positions in the cathode sheath of an abnormal DC Grimm-type glow discharge source operated in argon. The line profiles were recorded parallel to the cathode surface (side-on view), along the discharge axis from the cathode towards the negative glow. The spectra show a red line shift, which diminishes with the distance from the cathode surface and decreasing electric field. This allows experimental determination of the coefficient C in quadratic relation, Δν = CE2, between the wavenumber Stark shifts, Δν, and electric field strength, E. The above relation is a low-field (up to 25 kV/cm) approximation of the quadratic dependence of the upper-level shift, measured for a large set of argon lines at high electric fields (up to 700 kV/cm) by Windholz (Phys Scr 21:67–74, 1980). One of these lines, Ar I 537.349 nm, is used here for independent measurement of the electric field E and correlated with the Ar I 517.753 nm upper-level wavenumber shift Δν to obtain a line-specific coefficient C. In this way, the Ar I 517.753 nm spectral line complements the set of argon lines suitable for Stark spectroscopy diagnostics of the electric field distribution and cathode sheath length, the knowledge of which allows for a better understanding and description of the glow discharge processes through various theoretical models. Graphical abstract: [Figure not available: see fulltext.]. |
URI: | https://physrep.ff.bg.ac.rs/handle/123456789/1377 | ISSN: | 14346060 | DOI: | 10.1140/epjd/s10053-022-00587-0 |
Appears in Collections: | Journal Article |
Show full item record
SCOPUSTM
Citations
1
checked on Nov 15, 2024
Page view(s)
34
checked on Nov 21, 2024
Google ScholarTM
Check
Altmetric
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.