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Please use this identifier to cite or link to this item: https://physrep.ff.bg.ac.rs/handle/123456789/186
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dc.contributor.authorSrećković, A.en
dc.contributor.authorBukvić, Srđanen
dc.contributor.authorDjeniže, S.en
dc.date.accessioned2022-07-05T16:23:51Z-
dc.date.available2022-07-05T16:23:51Z-
dc.date.issued1998-01-01en
dc.identifier.issn0031-8949en
dc.identifier.urihttps://physrep.ff.bg.ac.rs/handle/123456789/186-
dc.description.abstractStark widths and shifts of five Si I line were measured at 28 500 K electron temperature and 1.9 × 1023 m-3 electron density in a linear, low-pressure, pulsed arc operated in argon-helium mixture. Our data are compared with values calculated on the basis of quasistatic approximation.en
dc.relation.ispartofPhysica Scriptaen
dc.titleMeasured stark widths and shifts of neutral silicon spectral linesen
dc.typeArticleen
dc.identifier.doi10.1088/0031-8949/57/2/012en
dc.identifier.scopus2-s2.0-0000624040en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/0000624040en
dc.relation.issue2en
dc.relation.volume57en
dc.relation.firstpage225en
dc.relation.lastpage227en
item.openairetypeArticle-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
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