Please use this identifier to cite or link to this item: https://physrep.ff.bg.ac.rs/handle/123456789/186
Title: Measured stark widths and shifts of neutral silicon spectral lines
Authors: Srećković, A.
Bukvić, Srđan 
Djeniže, S.
Issue Date: 1-Jan-1998
Journal: Physica Scripta
Abstract: 
Stark widths and shifts of five Si I line were measured at 28 500 K electron temperature and 1.9 × 1023 m-3 electron density in a linear, low-pressure, pulsed arc operated in argon-helium mixture. Our data are compared with values calculated on the basis of quasistatic approximation.
URI: https://physrep.ff.bg.ac.rs/handle/123456789/186
ISSN: 0031-8949
DOI: 10.1088/0031-8949/57/2/012
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