Please use this identifier to cite or link to this item: https://physrep.ff.bg.ac.rs/handle/123456789/736
DC FieldValueLanguage
dc.contributor.authorNikolić, Zoranen
dc.contributor.authorPavlović, V. B.en
dc.date.accessioned2022-07-12T16:41:46Z-
dc.date.available2022-07-12T16:41:46Z-
dc.date.issued2004-01-01en
dc.identifier.issn0255-5476en
dc.identifier.urihttps://physrep.ff.bg.ac.rs/handle/123456789/736-
dc.description.abstractIt is well known that, due to their specific properties, ZnO - based materials are frequently used in electrotechnics and electronics. Since these properties are very much dependent on the microstructural state of material (grain size, pore size, grain and pore distribution), in this article systematic investigation of evolution of microstructural constituents occurred during sintering of ZnO has been performed by new digital pattern recognition method (DPR). Microstructure investigations of the influence of the sintering regime on microstuctural development of ZnO ceramics were carried out, using the scanning electron microscope (SEM) digital pictures, their contour recognition and decomposition of digital image objects according to their gray scale intensity (automatic microstructural analysis). The obtained results enable to establish the sintering parameters, which are indispensable for processing of materials with advanced required properties.en
dc.relation.ispartofMaterials Science Forumen
dc.subjectDPR Analysisen
dc.subjectMicrostructureen
dc.subjectSinteringen
dc.subjectZinc-oxideen
dc.titleDPR analysis of microstructural evolution of ZnO ceramicsen
dc.typeConference Paperen
dc.identifier.doi10.4028/www.scientific.net/msf.453-454.453en
dc.identifier.scopus2-s2.0-3142740314en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/3142740314en
dc.relation.volume453-454en
dc.relation.firstpage453en
dc.relation.lastpage458en
item.grantfulltextnone-
item.openairetypeConference Paper-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.fulltextNo Fulltext-
Appears in Collections:Conference paper
Show simple item record

SCOPUSTM   
Citations

2
checked on Sep 28, 2024

Page view(s)

18
checked on Oct 5, 2024

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.