Please use this identifier to cite or link to this item: https://physrep.ff.bg.ac.rs/handle/123456789/715
Title: The effect of oxidation on structural and electrical properties of single wall carbon nanotubes
Authors: Marković, Zoran M.
Peruško, Davor B.
Tošić, Dragana D.
Romčević, Nebojša Z.
Dramićanin, Miroslav D.
Nikolić, Zoran
Marković, Biljana M.Todorović
Keywords: Atomic force microscopy;Fourier transform infrared spectroscopy;Raman spectroscopy;Sheet resistance;Single wall carbon nanotubes
Issue Date: 14-Sep-2011
Journal: Hemijska Industrija
Abstract: 
Single wall carbon nanotubes (SWCNTs) represent an important group of nanomaterials with attractive electrical, chemical, and mechanical properties. In this work we have investigated the structural, optical and electrical properties of single wall carbon nanotube films deposited on copper substrate and then transferred to polymethyl methacrylate (PMMA). The properties of deposited films were varied by changing different parameters: substrate temperature, deposition time and electric field strength. Atomic force microscopy (AFM) was used to study the deposition process of SWCNT films on copper substrate. AFM analysis has shown that sodium dodecyl sulfate (SDS) micellas were deposited on copper substrate before carbon nanotubes because of their higher mobility. Raman spectroscopy revealed that SWCNTs deposited at elevated temperatures are oxidized. FTIR results showed that COOH groups and Cu2O were generated during electrophoretic process. The SWCNT films were transferred to PMMA substrate and they achieved a sheet resistance of 360 Ω/sq with 79% transparency at 550 nm wavelength and a strong adhesion to the substrate. The main reasons for higher values of sheet resistances of SWCNT thin films compared to those of other authors are oxidation of carbon nanotubes during electrophoresis and the presence of used surfactans in carbon matrix of deposited films.
URI: https://physrep.ff.bg.ac.rs/handle/123456789/715
ISSN: 0367-598X
DOI: 10.2298/HEMIND110221024M
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