Please use this identifier to cite or link to this item: https://physrep.ff.bg.ac.rs/handle/123456789/311
Title: Silicon surface exfoliation under compression plasma flow action
Authors: Dojčinović, I. P.
Kuraica, Milorad
Randjelović, D.
Mati Ć, M.
Puri Ć, J.
Issue Date: 1-Jan-2006
Journal: 2006 25th International Conference on Microelectronics, MIEL 2006 - Proceedings
Abstract: 
Silicon single crystal surfaces have been modified by supersonic compression plasma flows (CPF) action. Triangular and rhombic regular fracture features are obtained on the Si (111), while rectangular ones are produced on Si (100) surface. Some of these regular structures can become free from the underlying bulk, formed as blocks ejected from the surface. Surface cleavage and exfoliation phenomena as the results of specific conditions during CPF interaction on silicon surface are, also, observed. Such conditions are the results of rapid heating and melting of surface layer, long existence of molten layer (∼40 μs) and fast cooling and recrystalisation taking place under the high dynamic pressure and thermodynamic parameters gradients. © 2006 IEEE.
URI: https://physrep.ff.bg.ac.rs/handle/123456789/311
ISBN: 1424401178
DOI: 10.1109/ICMEL.2006.1650915
Appears in Collections:Conference paper

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